Path Oriented DEcision Making (PODEM) is an ATPG algorithm used in digital circuit testing that finds test vectors to uncover single stuck-at faults (SSFs) which may happen to signal lines in fabrication process. As the goal of testing is to prevent shipping of faulty chips to customers, manufacturers expect high fault coverage and low defect level.
- Bushnell, M. L., & Agrawal, V. D. (2002). Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. In Frontiers in Electronic Testing. Springer US. https://doi.org/10.1007/b117406